Bits for flagging mechanisms

The bits used for flagging mechanisms are employed for each level of data:

0.

zero occupancy;

1.

fails TAC both-side cuts;

2.

fails TAC low-side cut only;

3.

fails TAC high-side cut only;

4.

fails QHS both-side cuts;

5.

fails QHS low-side cut only;

6.

fails QHS high-side cut only;

7.

fails QHL both-side cuts;

8.

fails QHL low-side cuts;

9.

fails QHL high-side cuts;

10.

fails QLX both-side cuts;

11.

fails QLX low-side cuts;

12.

fails QLX high-side cuts;

13.

fails synclear test;

14.

fails cell ID increment test;

15.

fails excessive orphan cut;

16.

fails high occupancy cut;

17.

fails low occupancy cut;

18.

fails EHS/ELX gain ratio cut;

24.

fails last PCA TAC test;

25.

fails last PCA QHS test;

26.

fails last PCA QHL test;

27.

fails last PCA QLX test;

28.

fails last PCA gain ratio test.